HIF 2010
18th International Symposium
on Heavy Ion Inertial Fusion -
Information

Title:	Mr.
Family Name:	Becker
First Name:	Frank
E-Mail:	Frank.Beckergsi.de
Affiliation for Badge:	GSI, Darmstadt
Institute:
Address (Street):	Planckstrasse 1
Postal Code, City:	64291, Darmstadt
Country:	Germany
Phone:	+49 (0) 6159 71 2676
Fax:	+49 (0) 6159 71 2104
Payment:	Bank transfer to GSI
Author(s):	F. Becker 1), P. Forck 1), T. Giacomini 1), R. Haseitl 1), A. Hug 1), B. Walasek-Hoehne 1), F. Bieniosek 2), P.A. Ni 2) , A. Ulrich 3) , D.H.H. Hoffmann 4)
Institute(s):	1) GSI, Helmholtzzentrum für Schwerionenforschung GmbH 2) LBNL, Berkeley, California 3) Department E-13, Technische Universität München 4) Institut für Kernphysik, Technische Universität Darmstadt
Title:	Non-Intercepting Beam Profile Monitors Based on Residual Gas Interaction
Abstract:	As conventional intercepting diagnostics will not withstand high intensity ion beams, profile monitors based on residual gas interaction constitute a pre-eminent alternative for non-intercepting profile measurements. Beam Induced Fluorescence (BIF) makes use of the optical fluorescence emission of beam-excited gases. Recently BIF became an important diagnostic tool for transversal beam profile measurements at the UNILAC. Fundamental results concerning the BIF-principle, like optical VIS-spectroscopy in nitrogen and rare gases, as well as limitations due to gas dynamics are discussed. Ongoing research and experiments to improve the detector performance and its applications are presented. Ionization Profile Monitors (IPM) rely on the detection of residual gas ions and might serve as an alternative to the BIF method. In this talk a short overview of non-intercepting beam diagnostics for high intensity heavy ion beams will be given.
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