8th International Topical SPARC Workshop
and SPARC Lecture Days
Moscow, September 5-10, 2011 -
Information

Title:	Prof.
Family Name:	Foerster
First Name:	Eckhart
Gender:	male
E-Mail:	e.foersteruni-jena.de
Affiliation for Badge:	Helmholtz-Institute, Jena
Institute:
Address (Street):	Helmholtzweg 4
Postal Code, City:	07743 Jena
Country:	Germany
Phone:	+49 3641 947260
Fax:	+49 3641 947262
Arrival Date:	September 4
Departure Date:	September 10
Type of Participation:	Regular
Are you a member of the SPARC collaboration ?:	Yes
I register for:	Both
	Selected
Contribution Type:	Oral
Author(s):	E. Förster, H.F. Beyer, I. Uschmann, O. Wehrhan, Th. Stöhlker
Institute(s):	Helmholtz Institute, Jena Institute of Optics and Quantum Electronics, University of Jena GSI Darmstadt, Germany
Title:	High-Resolution X-Ray Spectroscopy
Abstract:	Bent-crystal X-ray spectroscopy is a crucial part of many atom and plasma physics experiments, because optimisation of geometry and Bragg reflection parameters can be directed to high throughput and resolution, respectively. If desired, energy resolution can even be combined with space and time resolution. Diagnosing hard X-rays (E > 30 keV) spectroscopes apply bent crystals in transmission, as the FOCAL instrument. They provide relatively high throughput and excellent energy resolution. For softer X-rays one- and two-dimensionally bent crystals have been used very successfully in the reflection case. Precise fabrication and test of bent crystals is a great challenge and needs special equipment and skilled personnell.

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