8th International Topical SPARC Workshop
and SPARC Lecture Days
Moscow, September 5-10, 2011 -
Information

Title:	Dr.
Family Name:	Andreev
First Name:	Oleg
Gender:	male
E-Mail:	olyuangmail.com
Affiliation for Badge:	St. Petersburg State University
Institute:
Address (Street):	Ulyanovskaya 1
Postal Code, City:	198504, Petergof, St. Petersburg
Country:	Russia
Phone:	+78124284297
Fax:	+78124287240
Arrival Date:	September 6
Departure Date:	September 10
Type of Participation:	Regular
Are you a member of the SPARC collaboration ?:	Yes
I register for:	Topical SPARC Workshop
	Selected
Contribution Type:	Oral
Author(s):	O. Yu. Andreev
Institute(s):	St. Petersburg State University
Title:	Capture of one and two electrons by highly charged ions
Abstract:	The line-profile approach (LPA) [1] is applied to evaluation of the electron recombination with highly charged ions within the framework of QED. Capture of one electron by a one-electron highly charged ion and capture of two electrons by a bare atomic nucleus is considered. For the one-electron capture the initial state is presented by a one-electron highly charged ion being in the ground state and an incident electron. The capture to double-excited states ((2s,2s), (2s,2p), (2p,2p)) is considered. The final state is given either by a two-electron ion in the ground state (dielectronic recombination and radiative recombination) [2] or by a one-electron ion in the ground state and an emitted (Auger) electron (resonant scattering). For the two electrons capture the initial state is presented by a bare atomic nucleus and two incident electrons. The final state is given by two-electron ion in the ground state. The processes of electron capture are investigated experimentally and theoretically: the dielectronic and radiative recombination of one electron in [3,4], the resonant scattering in [5], the two-electron capture in [6,7]. [1] O.Yu. Andreev, et al., Phys. Rep. 455, 135 (2008). [2] O.Yu. Andreev, et al., Phys. Rev. A 80, 042514 (2009). [3] D. Bernhardt, et al., Phys. Rev. A 83, 020701 (2011). [4] S. Zakowicz, et al., J. Phys. B 37, 131 (2004). [5] P. Richard, et al., Phys. Scr. T80, 87 (1999). [6] A. Simon, et al., Phys. Rev. Lett. 104, 123001 (2010). [7] A.I. Mikhailov, et al., Phys. Lett. A, 328, 350 (2004).

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