CBM2007 - 9. Collaboration Meeting
Februar 27 - March 2, 2007 -
Registered Participants Information

Title:	Dr.
Last Name:	Simakov
First Name:	Andrey
E-Mail:	simakovmephi.ru
Affiliation for Badge:	MEPhI, Moscow
Institute:
Address (Street):	Kashirskoe shosse
Postal Code, City:	115409, Moscow
Country:	Russia
Phone:	(495) 323-91-91
Fax:	(495) 324-21-11
Arrival Date:	February 26
Departure Date:	March 3
Hotel Information:	Others...
Author(s):	Bocharov Yu., Poliakov A., Simakov A. Some results of rad-tolerence tests. (2006 UMC 0.18 um run). Bocharov Yu., Poliakov A., Simakov A. Some results of rad-tolerence tests. (2006 UMC 0.18 um run). Simakov A.,Bocharov Yu., Poliakov A.
Institute(s):	MEPHI
Title:	Some results of red-tolerence tests (2006, UMC 0.18um run)
Abstract:	Two test structures: 1) Standart NMOS Transistor; 2) Enclosed Layout Transistor (ELT) were red-tested by linear electron beam accelerator with energy 8 MeV at doses: 10-5rad; 10-6 rad; 3x10-6 rad. The results of characteristics degradation are given.